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Flatness check with Solartron probes

Solartron metrology offer solution for critical flatness feature in Electronics and Automotive components. Everything from Cell Phone glass to semi-conductor wafers may carry sub-micron tolerances for flatness. For this, several points over a small surface area must be checked, with a high accuracy being a key feature.

  • Class leading resolution of down to 0.01µm
  • Repeatability of up to 0.015µm
  • Low tip forces
  • Measure Multiple points easy.
  • Lower cost